Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics W. Vogel & M. Büttner GmbH The Opportunities and Threats Facing

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Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics W. Vogel & M. Büttner GmbH The Opportunities and Threats FacingThis book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross talk, electromigration, self heat, etc. are becoming important. Cross talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending